Browsing by Author "De Pauw, P."
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Publication A simple, cost effective and very sensitive alternative for photon emission spectroscopy
; ; Publication Analysis of Iddq failures through spectral photon emission microscopy
Journal article1998, Microelectronics Reliability, (38) 6_8, p.877-882Publication Analysis of Iddq failures through spectral photon emission microscopy
Proceedings paper1998, Proceedings of the 9th European Symposium on Reliability of Electron Devices and Failure Physics - ESREF, 5/10/1998, p.877-882Publication Comparison of two coaxial probes for measuring the steel fiber content in fiber reinforced concrete slabs
Publication The influence of addition elements on the early resistance changes observed during electromigration testing of Al metal lines
Journal article1998, Microelectronics Reliability, (38) 1, p.87-98