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Analysis of Iddq failures through spectral photon emission microscopy
Publication:
Analysis of Iddq failures through spectral photon emission microscopy
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Date
1998
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rasras, Mahmoud
;
De Wolf, Ingrid
;
Bender, Hugo
;
Groeseneken, Guido
;
Maes, Herman
;
Verhaverbeke, Steven
;
De Pauw, P.
Journal
Microelectronics Reliability
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1886
since deposited on 2021-10-01
Acq. date: 2025-12-11
Citations
Metrics
Views
1886
since deposited on 2021-10-01
Acq. date: 2025-12-11
Citations