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Analysis of Iddq failures through spectral photon emission microscopy
Publication:
Analysis of Iddq failures through spectral photon emission microscopy
Date
1998
Journal article
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2559.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rasras, Mahmoud
;
De Wolf, Ingrid
;
Bender, Hugo
;
Groeseneken, Guido
;
Maes, Herman
;
Verhaverbeke, Steven
;
De Pauw, P.
Journal
Microelectronics Reliability
Abstract
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1886
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411
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Acq. date: 2025-10-24
Citations
Metrics
Views
1886
since deposited on 2021-10-01
411
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations