Publication:

Analysis of Iddq failures through spectral photon emission microscopy

Date

1998
Journal article
Simple item page Full metadata Statistics
 
dc.contributor.authorRasras, Mahmoud
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorBender, Hugo
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorMaes, Herman
dc.contributor.authorVerhaverbeke, Steven
dc.contributor.authorDe Pauw, P.
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorGroeseneken, Guido
dc.date.accessioned2021-10-01T08:46:23Z
dc.date.available2021-10-01T08:46:23Z
dc.date.embargo9999-12-31
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2897
dc.source.beginpage877
dc.source.endpage882
dc.source.issue6_8
dc.source.journalMicroelectronics Reliability
dc.source.volume38
dc.title

Analysis of Iddq failures through spectral photon emission microscopy

dc.typeJournal article
dspace.entity.typePublication
Files

Original bundle

Name:
2559.pdf
Size:
1.19 MB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Articles