Publication:

Analysis of Iddq failures through spectral photon emission microscopy

Date

1998
Journal article
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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0003-3763-2098
cris.virtual.orcid0000-0003-3822-5953
cris.virtualsource.department2fcc3f32-b96b-4ece-a34c-e0dd87c237c9
cris.virtualsource.department99f46578-0b77-4a3f-b8e5-a6879cd2ea9a
cris.virtualsource.orcid2fcc3f32-b96b-4ece-a34c-e0dd87c237c9
cris.virtualsource.orcid99f46578-0b77-4a3f-b8e5-a6879cd2ea9a
dc.contributor.authorRasras, Mahmoud
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorBender, Hugo
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorMaes, Herman
dc.contributor.authorVerhaverbeke, Steven
dc.contributor.authorDe Pauw, P.
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorGroeseneken, Guido
dc.date.accessioned2021-10-01T08:46:23Z
dc.date.available2021-10-01T08:46:23Z
dc.date.embargo9999-12-31
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2897
dc.source.beginpage877
dc.source.endpage882
dc.source.issue6_8
dc.source.journalMicroelectronics Reliability
dc.source.volume38
dc.title

Analysis of Iddq failures through spectral photon emission microscopy

dc.typeJournal article
dspace.entity.typePublication
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