Browsing by Author "De Smedt, R."
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Publication Accurate characterization of some radiative EMC phenomena at chip level, using dedicated EMC-testchips
Proceedings paper1998, International Symposium on Electromagnetic Compatibility. Symposium Record, 24/08/1998, p.734-738Publication Approximate simulation of the shielding effectiveness of a rectangular enclosure with a grid wall
; Publication Assessment of the shielding effectiveness of a real enclosure
; Publication Comparison of FDTD and MoM for shielding effectiveness modelling of test enclosures
; Publication Fast evaluation of the shielding efficiency of rectangular shielding enclosures
Proceedings paper1998, International Symposium on Electromagnetic Compatibility. Symposium Record, 24/08/1998, p.311-316Publication Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems
Proceedings paper1996, Proceedings IEEE Instrumentation and Measurement Technology Conference, 4/06/1996, p.1119-1123Publication Numerical and experimental study of the shielding effectiveness of a metallic enclosure
Journal article1999, IEEE Trans. Electromagnetic Compatibility, (41) 3, p.202-213Publication Samenwerking Industrie-Universiteit Helpt de EMC-Materie te Ontmaskeren
Journal article1995, Het Ingenieursblad, 64, p.21-34Publication Simulations of small apertures and grids by the FDTD method
Proceedings paper1998, EMC'98. International Symposium on Electromagnetic Compatibility, 14/09/1998, p.328-332Publication Theoretical and experimental determination of the shielding effectiveness of test enclosures
Proceedings paper1997, Proceedings of the 12th International Zürich Symposium and Technical Exhibition on Electromagnetic Compatibility, 18/02/1997, p.223-228Publication Theoretical and experimental quantitative characterization of the near-fields of printed circuit board interconnection structures
Proceedings paper1995, Atlanta 1995.EMC - a Global Concern. IEEE 1995 International Symposium on Electromagnetic Compatibility. Symposium Record; Augus, p.471-474