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Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems
Publication:
Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems
Date
1996
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Haelvoet, Kurt
;
Criel, Steven
;
Dobbelaere, Franky
;
Martens, Luc
;
De Langhe, Pascal
;
De Smedt, R.
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2021
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
2021
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations