Publication:
Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems
Date
| dc.contributor.author | Haelvoet, Kurt | |
| dc.contributor.author | Criel, Steven | |
| dc.contributor.author | Dobbelaere, Franky | |
| dc.contributor.author | Martens, Luc | |
| dc.contributor.author | De Langhe, Pascal | |
| dc.contributor.author | De Smedt, R. | |
| dc.contributor.imecauthor | Martens, Luc | |
| dc.date.accessioned | 2021-09-29T14:32:02Z | |
| dc.date.available | 2021-09-29T14:32:02Z | |
| dc.date.issued | 1996 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/1245 | |
| dc.source.beginpage | 1119 | |
| dc.source.conference | Proceedings IEEE Instrumentation and Measurement Technology Conference | |
| dc.source.conferencedate | 4/06/1996 | |
| dc.source.conferencelocation | Brussels Belgium | |
| dc.source.endpage | 1123 | |
| dc.title | Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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