Browsing by Author "Delaey, L."
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Publication A novel approach to the short stripe effect in electromigration: modeling and experiment
Oral presentation2000, Materials for Advanced Metallization Conference - MAM; February 28 - March 1, 2000; Stresa, Italy.Publication Compensation effect during water desorption from siloxane-based spin-on dielectric thin films
Journal article2000, J. Vacuum Science and Technology B, (B18) 1, p.303-306Publication Electromigration threshold in damascene versus plasma-etched interconnects
Journal article1998, Applied Physics Letters, (73) 19, p.2748-2750Publication Electromigration-induced drift in damascene and plasma-etched Al(Cu). II: Mass transport mechanisms in bamboo interconnects
Journal article2000, Journal of Applied Physics, (87) 1, p.99-109Publication Evaluation of room temperature wafer bonding by fabrication of a GaAs/Pt/Si metal base transistor
Proceedings paper1999, ESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference, 13/09/1999, p.280-283Publication Evaluation of vacuum bonded GaAs/Si spin-valve transistors
Journal article2000, J. Applied Physics, (87) 9, Part 2, p.5155-5157Publication Evaluation of wafer bonding technology and the GaAs/Si spin-valve transistor
Meeting abstract2000, NEVAC / NNV Symposium "Toepassingen van Magnetische Nanostrukturen", 17/11/2000, p.23Publication GaAs/Si hybrid spin-valve transistors
Oral presentation2000, 5th MEL-ARI/NID Workshop; 23-26 February 2000; Pisa, Italy.Publication GaAs/Si spin-valve transistors with improved transfer coefficient
Meeting abstract2000, International Conference on Magnetism - ICM, 6/08/2000Publication Improvement of the transfer coefficient of GaAs/Si spin-valve transistors
Journal article2001, Journal of Magnetism and Magnetic Materials, 226-230, p.2081-2083Publication Plasticity of electromigration-induced hillocking and how it affects the critical length
Oral presentation2001, Symposium P of the MRS Spring Meeting: Dislocations and Deformation Mechanisms in Thin Films and Small Structures; 17-19 April 2Publication Plasticity of electromigration-induced hillocking and its effect on the critical length
Journal article2002, Journal of Applied Physics, (91) 11, p.9108-9115Publication The role of grain boundary structure on electromigration-induced drift in pure Al and Al(0.5wt% Cu)
Journal article1998, Scripta Materialia, (39) 8, p.1039-1045Publication The vacuum wafer bonding technique as an alternative method for the fabrication of metal/semiconductor heterostructures
Oral presentation2000, 11th International Conference on Molecular Beam Epitaxy - MBE-XI; 10-15 September 2000; Bejing, China.Publication The vacuum wafer bonding technique as an alternative method for the fabrication of metal/semiconductor heterostructures
Journal article2001, Journal of Crystal Growth, 227, p.906-910