Browsing by Author "Diehle, Patrick"
Now showing 1 - 3 of 3
- Results per page
- Sort Options
Publication Challenges and Perspectives for Vertical GaN-on-Si Trench MOS Reliability: From Leakage Current Analysis to Gate Stack Optimization
Journal article review2021, MATERIALS, (14) 9, p.2316Publication Doping investigation of structured GaN devices by highly lateral resolved TOF-SIMS
Journal article2025, POWER ELECTRONIC DEVICES AND COMPONENTS, (10) March, p.100082Publication Root cause analysis of gate shorts in semi-vertical GaN MOSFET devices