Browsing by Author "Diehle, Patrick"

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Challenges and Perspectives for Vertical GaN-on-Si Trench MOS Reliability: From Leakage Current Analysis to Gate Stack Optimization

Mukherjee, Kalparupa
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De Santi, Carlo
;
Borga, Matteo
;
Geens, Karen
;
You, Shuzhen
Journal article review
2021, MATERIALS, (14) 9, p.2316
Root cause analysis of gate shorts in semi-vertical GaN MOSFET devices

Diehle, Patrick
;
Hübner, Susanne
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De Santi, Carlo
;
Mukherjee, Kalparupa
;
Zanoni, Enrico
Proceedings paper
2021, International Conference on Advanced Semi-conductor Devices And Microsystems, 11/10/2020, p.10-13