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Browsing by Author "Dobbie, Andrew"

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    Channel backscattering characteristics of high performance germanium pMOSFETs

    Dobbie, Andrew
    ;
    De Jaeger, Brice  
    ;
    Meuris, Marc  
    ;
    Whall, T.E
    ;
    Leadley, D.R
    Proceedings paper
    2008, 9th International Conference on ULtimate Integration on Silicon - ULIS, 12/03/2008, p.7-10
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    High hole mobility in 65 nm strained Ge p-channel field effect transistors with HfO2 gate dielectric

    Mitard, Jerome  
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    De Jaeger, Brice  
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    Eneman, Geert  
    ;
    Dobbie, Andrew
    ;
    Myronov, M.
    ;
    Kobayashi, Masaharu
    Journal article
    2011, Japanese Journal of Applied Physics, (50) 4, p.04DC17
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    High hole-mobility 65nm biaxially-strained Ge-pFETs: fabrication, analysis and optimization

    Mitard, Jerome  
    ;
    De Jaeger, Brice  
    ;
    Eneman, Geert  
    ;
    Dobbie, Andrew
    ;
    Myronov, M.
    ;
    Kobayashi, Masaharu
    Proceedings paper
    2010, International Conference on Solid-State Devices and Materials - SSDM, 22/09/2010, p.1038-1039

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