Browsing by Author "Dobri, Adam"
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Publication Profiling of border traps at GeSn and high-K oxide interface
Meeting abstract2014-10, Japanese Society for the Promotion of Sciences - JSPS, 5/10/2014, p.P3-1647Publication Profiling of border traps at GeSn and high-K oxide interface
Meeting abstract2014, ECS 2014 Fall Meeting, Symposium P3: High Purity and High Mobility Semiconductors 13, 5/10/2014, p.1647