Publication:

Profiling of border traps at GeSn and high-K oxide interface

Date

2014-10

Meeting abstract

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Author(s)

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Vrielinck, Henk

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Lauwaert, Johan

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Merckling, Clement

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Gencarelli, Federica

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Shimura, Yosuke

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Statistics

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Acq. date: 2026-04-06