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Profiling of border traps at GeSn and high-K oxide interface
Publication:
Profiling of border traps at GeSn and high-K oxide interface
Date
2014-10
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gupta, Somya
;
Simoen, Eddy
;
Dobri, Adam
;
Vrielinck, Henk
;
Lauwaert, Johan
;
Merckling, Clement
;
Gencarelli, Federica
;
Shimura, Yosuke
;
Loo, Roger
;
Heyns, Marc
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1922
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations
Metrics
Views
1922
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations