Publication:

Profiling of border traps at GeSn and high-K oxide interface

Date

2014-10
Meeting abstract
Simple item page Full metadata Statistics
 
dc.contributor.authorGupta, Somya
dc.contributor.authorSimoen, Eddy
dc.contributor.authorDobri, Adam
dc.contributor.authorVrielinck, Henk
dc.contributor.authorLauwaert, Johan
dc.contributor.authorMerckling, Clement
dc.contributor.authorGencarelli, Federica
dc.contributor.authorShimura, Yosuke
dc.contributor.authorLoo, Roger
dc.contributor.authorHeyns, Marc
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorMerckling, Clement
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecMerckling, Clement::0000-0003-3084-2543
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.date.accessioned2021-10-22T01:47:39Z
dc.date.available2021-10-22T01:47:39Z
dc.date.issued2014-10
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23892
dc.source.beginpageP3-1647
dc.source.conferenceJapanese Society for the Promotion of Sciences - JSPS
dc.source.conferencedate5/10/2014
dc.source.conferencelocationCancun Mexico
dc.title

Profiling of border traps at GeSn and high-K oxide interface

dc.typeMeeting abstract
dspace.entity.typePublication
Files
Publication available in collections:
Conference contributions