Browsing by Author "Dou, Chunmeng"
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Publication Determination of energy and spatial distribution of oxide border traps in In0.53Ga0.47As MOS capacitors fron capacitance-voltage characteristics measured at various temperatures
Journal article2014, Microelectronics Reliability, (54) 4, p.746-754Publication On the temperature dependence of frequency dispersion in C-V measurements of III-V MOS devices and its application in spatial profiling of border traps
Meeting abstract2013, 44th IEEE Semiconductor Interface Specialists Conference, 5/12/2013Publication Temperature dependence of frequency dispersion in III–V metal-oxide-semiconductor C-V and the capture/emission process of border traps
Journal article2015, Applied Physics Letters, (107) 5, p.53504