Browsing by Author "El-Kazzi, Mario"
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Publication H2S molecular beam passivation of Ge(001)
Journal article2011, Microelectronic Engineering, (88) 4, p.399-402Publication High oxidation state at the epitaxial interface of g-Al2O3 thin films grown on Si(111) and Si(001)
Journal article2010, Applied Physics Letters, (97) 15, p.151902Publication Molecular beam epitaxy passivation studies of Ge and III-V semiconductors for advanced CMOS
Journal article2009, Microelectronic Engineering, (86) 7_9, p.1592-1595Publication Molecular Beam Epitaxy study of a common a-GeO2 interfacial passivation layer for Ge- and GaAs-based MOS heterostructures
Proceedings paper2009, CMOS Gate Stack Scaling. Materials, Interfaces, and Reliability, 13/04/2009, p.C06.07Publication Strategies for CMOS low equivalent oxide thickness achievement with high-k oxides grown on Si(001) by MBE
Proceedings paper2008, Materials Science of High-k Dielectric Stackx - From Fundamentals to Technology, 24/03/2008, p.1073-H3-08Publication Synchrotron radiation and conventional X-ray source photoemission studies of epitaxial g-Al2O3 thin films grown on Si(111) & Si(001) substrates by molecular beam epitaxy
Proceedings paper2009, CMOS Gate-Stack Scaling - Materials, Interfaces, and Reliability Implications, 13/04/2009, p.C08-08Publication X-ray photoelectron diffraction study of thin Al2O3 films grown on Si(111) by molecular beam epitaxy
Journal article2009, Physical Review B, (79) 19, p.195312