Browsing by Author "Farr, H."
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Publication Cu interconnect lifetime estimation in the presence of thermal gradients
Journal article2025, JOURNAL OF APPLIED PHYSICS, (137) 7, p.075106Publication Do's and don'ts for SiPho heater qualification
Proceedings paper2025, 2025 Conference on Smart Photonic and Optoelectronic Integrated Circuits, JAN 27-30, 2025Publication Thermomigration-induced void formation in Cu-interconnects - Assessment of main physical parameters
; ; ; ; ;Chavez, T.Farr, H.Proceedings paper2023, 61st IEEE International Reliability Physics Symposium (IRPS), MAR 26-30, 2023