Browsing by Author "Federico, Antonio"
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Publication Impact of Al2O3 position on performances and reliability in high-k metal gated DRAM periphery transistors
Proceedings paper2013, 43rd European Solid-State Device Research Conference - ESSDERC, 16/09/2013, p.190-193Publication Low-frequency noise assessment of border traps in Al2O3 capped DRAM peripheral MOSFETs
Journal article2014, Semiconductor Science and Technology, (29) 11, p.115015