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Browsing by Author "Fischer, Paul"

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    Post-direct-CMP dielectric surface copper contamination: quantitative analysis and impact on dielectric breakdown behaviour

    Heylen, Nancy  
    ;
    Li, Yunlong  
    ;
    Kellens, Kristof  
    ;
    Travaly, Youssef
    ;
    Vereecke, Guy  
    ;
    Volders, Henny  
    Proceedings paper
    2009, Advanced Metallization Conference 2008 (AMC2008), 23/09/2008, p.415-429
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    Thumbnail Image
    Publication

    Post-direct-CMP dielectric surface copper contamination: quantitative analysis and impact on dielectric breakdown behaviour

    Heylen, Nancy  
    ;
    Li, Yunlong  
    ;
    Travaly, Youssef
    ;
    Vereecke, Guy  
    ;
    Volders, Henny  
    ;
    Tokei, Zsolt  
    Meeting abstract
    2008, Advanced Metallization Conference - AMC, 23/09/2008

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