Browsing by Author "Frank, M."

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Initial growth kinetics of ALD Al2O3 and HfO2 and post-annealing effects

Wilk, G.D.
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Frank, M.
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Ho, M.Y.
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Green, Martin
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Chabal, Y.J.
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Raisanen, P.
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Brijs, Bert
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Sorsch, T.W.
Oral presentation
2002, Atomic Layer Deposition Conference - ALD
Test circuits for fast and reliable assessment if CDM robustness of I/O stages

Stadler, W.
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Esmark, K.
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Reynders, K.
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Zubeidat, M.
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Graf, M.
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Wilkening, W.
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Willemen, J.
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Qu, D.
Journal article
2005, Microelectronics Reliability, (45) 2, p.269-277
Test circuits for fast and reliable assessment of CDM robustness of I/O stages

Stadler, Wolfgang
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Esmark, K.
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Reynders, K.
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Zuhbeidat, M.
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Graf, M.
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Wilkening, W.
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Willemen, J.
Proceedings paper
2003, Proceedings 25th EOS/ESD Symposium, 21/09/2003, p.319-327