Browsing by Author "Gealy, Dan"
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Publication Correlation between the Vth-adjustment of nMOSFETs with HfSiO gate oxide and the energy profile of high-k bulk trap density
Journal article2010, IEEE Electron Device Letters, (31) 4, p.272-274Publication Ion-implantation-based low-cost Hk/MG process for CMOS low-power application
Proceedings paper2010, IEEE Symposium on VLSI Technology, 15/06/2010, p.185-186