Browsing by Author "Giusi, Gino"
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Publication Noise analysis inadvanced memory devices
Proceedings paper2015, China Semiconductor Technology International Conference - CSTIC, 15/03/2015, p.1-4Publication On the design of an automated system for the characterization of the electromigration performance of advanced interconnects by means of low frequency noise measurements
Journal article2019, Metrology and Measurement Systems, (26) 1, p.13-21Publication On the impact of defects close to the gate electrode on the low-frequency 1/f noise