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On the design of an automated system for the characterization of the electromigration performance of advanced interconnects by means of low frequency noise measurements
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On the design of an automated system for the characterization of the electromigration performance of advanced interconnects by means of low frequency noise measurements
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Date
2019
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Scandurra, Graziella
;
Beyne, Sofie
;
Giusi, Gino
;
Ciofi, Carmine
Journal
Metrology and Measurement Systems
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1918
since deposited on 2021-10-27
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last month
Acq. date: 2025-12-15
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Metrics
Views
1918
since deposited on 2021-10-27
1
last month
Acq. date: 2025-12-15
Citations