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On the design of an automated system for the characterization of the electromigration performance of advanced interconnects by means of low frequency noise measurements

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dc.contributor.authorScandurra, Graziella
dc.contributor.authorBeyne, Sofie
dc.contributor.authorGiusi, Gino
dc.contributor.authorCiofi, Carmine
dc.contributor.imecauthorBeyne, Sofie
dc.date.accessioned2021-10-27T17:38:51Z
dc.date.available2021-10-27T17:38:51Z
dc.date.issued2019
dc.identifier.issn0860-8229
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/33944
dc.identifier.urlhttp://www.czasopisma.pan.pl/Content/110249/PDF/art_02.pdf
dc.source.beginpage13
dc.source.endpage21
dc.source.issue1
dc.source.journalMetrology and Measurement Systems
dc.source.volume26
dc.title

On the design of an automated system for the characterization of the electromigration performance of advanced interconnects by means of low frequency noise measurements

dc.typeJournal article
dspace.entity.typePublication
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