Browsing by Author "Gornik, E."
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Publication Detailed study of the parasitic geometric current components in charge pumping measurements: determination of relevant parameters
Oral presentation1997, Semiconductor Interface Specialists' Conference - SISCPublication Optical testing of submicron-technology MOSFETs and bipolar transistors
; Proceedings paper1997, ESSDERC '97: Proceedings of the 27th European Solid-State Device Research Conference, 22/09/1997, p.372-375Publication Test circuits for fast and reliable assessment if CDM robustness of I/O stages
Publication Test circuits for fast and reliable assessment of CDM robustness of I/O stages