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Optical testing of submicron-technology MOSFETs and bipolar transistors
Publication:
Optical testing of submicron-technology MOSFETs and bipolar transistors
Date
1997
Proceedings Paper
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2067.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pogany, D.
;
Fürböck, C.
;
Seliger, N.
;
Habas, Predrag
;
Gornik, E.
;
Kubicek, Stefan
;
Decoutere, Stefaan
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1
since deposited on 2021-09-30
Acq. date: 2025-10-24
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since deposited on 2021-09-30
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item.page.metrics.field.last-week
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Citations
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Downloads
1
since deposited on 2021-09-30
Acq. date: 2025-10-24
Views
1940
since deposited on 2021-09-30
405
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations