Publication:

Optical testing of submicron-technology MOSFETs and bipolar transistors

Date

1997
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorPogany, D.
dc.contributor.authorFürböck, C.
dc.contributor.authorSeliger, N.
dc.contributor.authorHabas, Predrag
dc.contributor.authorGornik, E.
dc.contributor.authorKubicek, Stefan
dc.contributor.authorDecoutere, Stefaan
dc.contributor.imecauthorKubicek, Stefan
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.date.accessioned2021-09-30T09:25:12Z
dc.date.available2021-09-30T09:25:12Z
dc.date.embargo9999-12-31
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2092
dc.source.beginpage372
dc.source.conferenceESSDERC '97: Proceedings of the 27th European Solid-State Device Research Conference
dc.source.conferencedate22/09/1997
dc.source.conferencelocationStuttgart Germany
dc.source.endpage375
dc.title

Optical testing of submicron-technology MOSFETs and bipolar transistors

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
2067.pdf
Size:
266 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions