Browsing by Author "Gossner, Harald"
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Publication A quantitative inquisition into ESD sensitivity to strain in nanoscale CMOS protection devices
Proceedings paper2010, IEEE International Electron Devices Meeting - IEDM, 6/12/2010, p.808-811Publication Characterization and optimization of sub-32nm FinFET devices for ESD applications
Journal article2008, IEEE Transactions on Electron Devices, (55) 12, p.3507-3516Publication Design methodology for FinFET GG-NMOS ESD protecction devices
Proceedings paper2008-05, 2nd International ESD Workshop - IEW, 12/05/2008Publication Design methodology of FinFET devices that meet IC-level HBM ESD targets
Proceedings paper2008-09, 30th Electrical Overstress/Electrostatic Discharge Symposium - EOS/ESD, 7/09/2008, p.295-303Publication ESD-aspects of FinFETs and other most advanced devices
Oral presentation2010, International ESD Workshop - IEWPublication Impact of ESD on an electrical system ESDA WG26 working group results
Publication Understanding the optimization of sub-45nm FinFET devices for ESD applications
Proceedings paper2007, EOS/ESD Symposium Proceedings, 16/09/2007, p.408-415