Browsing by Author "Haegeman, Bart"
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Publication Electrical scanning probe techniques in semiconductor research
Oral presentation1999, DI-VEECO Users Workshop; September 1999; Bordeaux, France.Publication High resolution dopant/carrier profiling for deep submicron technologies
Oral presentation1999, 9th Canadian Semiconductor Technology Conference; July 1999; Ottawa, Canada.Publication Nanometer scale characterization of deep submicron devices
Oral presentation1999, Materials Research Society Spring Meeting: Symposium S on Si Front-End Processing - Physics and Technology of Dopant-Defect IntePublication Nanopotentiometry: data interpretation and quantification
Proceedings paper1999, ESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium., p.192-195Publication Probing semiconductor devices on the nanometer schale
Proceedings paper1999, ESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium., p.46-55