Browsing by Author "Hasebe,"
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Publication Analysis of high voltage ESD protection devices under HBM ESD stress
Proceedings paper2008-05, 2nd International ESD Workshop - IEW, 12/05/2008Publication Characterization and modeling of diodes in sub-45 nm CMOS technologies under HBM stress conditions
Proceedings paper2007, EOS/ESD Symposium Proceedings, 16/09/2007, p.158-164Publication Extreme voltage and current overshoots in HV snapback devices during HBM ESD stress
Proceedings paper2008-09, 30th EOS/ESD Symposium, 7/09/2008, p.204-210