Publication:
Characterization and modeling of diodes in sub-45 nm CMOS technologies under HBM stress conditions
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1899 since deposited on 2021-10-16
1last month
Acq. date: 2026-04-28
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Views
1899 since deposited on 2021-10-16
1last month
Acq. date: 2026-04-28
Citations