Browsing by Author "Herfurth, Norbert"
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Publication Contactless fault isolation of ultra low k dielectrics in soft breakdown condition
Proceedings paper2018, International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA, 16/07/2018, p.1-5Publication New access to soft breakdown parameters of low k dielectrics through localization-based analysis
;Herfurth, Norbert ;Simon-Najasek, M. ;Herfurth, R. ;Hübner, S. ;Altmann, FrankBeyreuther, A.Proceedings paper2019, 2019 IEEE International Reliability Physics Symposium (IRPS), 31/03/2019Publication Non-invasive soft breakdown localisation in low k dielectrics using photon emission microscopy and thermal laser stimulation
Journal article2019, Microelectronics Reliability, 92, p.73-78