Browsing by Author "Hermann, Peter"
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Publication Characterization of semiconductor samples using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy
Journal article2014, Optics Express, (22) 15, p.17948-17958Publication Grazing incidence X-ray fluorescence analysis for the characterization of Ge1-xSnx thin films
Meeting abstract2014, European Conference on X-Ray Spectrometry - EXRS, 15/06/2014Publication NEXAFS characterization of inorganic and organic materials for semiconductor application
Meeting abstract2014, European Conference on X-Ray Spectrometry - EXRS, 15/06/2014Publication Thermal stability and relaxation mechanisms in compressively-strained Ge0.94Sn0.06 thin films grown by molecular beam epitaxy
Journal article2016, Journal of Applied Physics, (120) 5, p.85309