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Grazing incidence X-ray fluorescence analysis for the characterization of Ge1-xSnx thin films
Publication:
Grazing incidence X-ray fluorescence analysis for the characterization of Ge1-xSnx thin films
Date
2014
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hoenicke, Philipp
;
Fleischmann, Claudia
;
Hermann, Peter
;
Beckhoff, Burkhard
Journal
Abstract
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1930
since deposited on 2021-10-22
Acq. date: 2025-10-25
Citations
Metrics
Views
1930
since deposited on 2021-10-22
Acq. date: 2025-10-25
Citations