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Grazing incidence X-ray fluorescence analysis for the characterization of Ge1-xSnx thin films

Date

2014
Meeting abstract
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dc.contributor.authorHoenicke, Philipp
dc.contributor.authorFleischmann, Claudia
dc.contributor.authorHermann, Peter
dc.contributor.authorBeckhoff, Burkhard
dc.contributor.imecauthorFleischmann, Claudia
dc.contributor.orcidimecFleischmann, Claudia::0000-0003-1531-6916
dc.date.accessioned2021-10-22T02:01:12Z
dc.date.available2021-10-22T02:01:12Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23944
dc.source.conferenceEuropean Conference on X-Ray Spectrometry - EXRS
dc.source.conferencedate15/06/2014
dc.source.conferencelocationBologna Italy
dc.title

Grazing incidence X-ray fluorescence analysis for the characterization of Ge1-xSnx thin films

dc.typeMeeting abstract
dspace.entity.typePublication
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