Browsing by Author "Hieckmann, E."
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Publication A deep level transient spectroscopy study on the interface states across grain boundaries in multicrystalline silicon
Journal article2011, Physica Status Solidi. Rapid Research Letters, (5) 8, p.277-279Publication Electrical properties along grain boundaries in multicrystalline silicon measured by capacitance technique
Oral presentation2011, E-MRS Spring Meeting Symposium R: Advanced Inorganic Materials and Concepts for PhotovoltaicsPublication On the electrical characterization of grain boundaries in multicrytalline silicon
Proceedings paper2011, Photovoltaics for the 21st Century 6, 10/10/2010, p.71-80