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Browsing by Author "Holmes, D."

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    Characterisation of plasma etch related residues formed on top of ECD Cu

    Baklanov, Mikhaïl
    ;
    Conard, Thierry  
    ;
    Lanckmans, Filip
    ;
    Vanhaelemeersch, Serge  
    ;
    Holmes, D.
    Oral presentation
    1999, Advanced Metallization Conference; 28-30 September 1999; Orlando, FL, USA.
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    Characterisation of plasma etch releted residues formed on top of ECD Cu films

    Baklanov, Mikhaïl
    ;
    Conard, Thierry  
    ;
    Lanckmans, Filip
    ;
    Vanhaelemeersch, Serge  
    ;
    Holmes, D.
    Proceedings paper
    2000, Advanced Metallization Conference 1999 - AMC 1999, 28/09/1999, p.615-619

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