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Browsing by Author "Hooker, J.C."

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    Novel process to pattern selectively dual dielectric capping layers using soft-mask only

    Schram, Tom  
    ;
    Kubicek, Stefan  
    ;
    Rohr, Erika
    ;
    Brus, Stephan  
    ;
    Vrancken, Christa  
    ;
    Chang, Shou-Zen
    Proceedings paper
    2008, Symposium on VLSI Technology Digest of Technical Papers, 17/06/2008, p.44-45
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    Quantitative prediction of junction leakage in bulk-technology CMOS devices

    Duffy, R.
    ;
    Heringa, A.
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    Venezia, V.C.
    ;
    Loo, Josine
    ;
    Verheijen, M.A.
    ;
    Hopstaken, M.J.P.
    Journal article
    2010, Solid-State Electronics, (54) 3, p.243-251

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