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Novel process to pattern selectively dual dielectric capping layers using soft-mask only
Publication:
Novel process to pattern selectively dual dielectric capping layers using soft-mask only
Date
2008
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Schram, Tom
;
Kubicek, Stefan
;
Rohr, Erika
;
Brus, Stephan
;
Vrancken, Christa
;
Chang, Shou-Zen
;
Chang, V.S.
;
Mitsuhashi, Riichiru
;
Okuno, Yasutoshi
;
Akheyar, Amal
;
Cho, Hag-Ju
;
Hooker, J.C.
;
Paraschiv, Vasile
;
Vos, Rita
;
Sebaai, Farid
;
Ercken, Monique
;
Kelkar, Prasad
;
Delabie, Annelies
;
Adelmann, Christoph
;
Witters, Thomas
;
Ragnarsson, Lars-Ake
;
Kerner, Christoph
;
Chiarella, Thomas
;
Aoulaiche, Marc
;
Cho, Moon Ju
;
Kauerauf, Thomas
;
De Meyer, Kristin
;
Lauwers, Anne
;
Hoffmann, Thomas Y.
;
Absil, Philippe
;
Biesemans, Serge
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Views
1940
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1940
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations