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  4. Novel process to pattern selectively dual dielectric capping layers using soft-mask only
 
Publication:

Novel process to pattern selectively dual dielectric capping layers using soft-mask only

Date

2008
Proceedings Paper
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16051.pdf 164.92 KB

Author(s)

Schram, Tom  
;
Kubicek, Stefan  
;
Rohr, Erika
;
Brus, Stephan  
;
Vrancken, Christa  
;
Chang, Shou-Zen
;
Chang, V.S.
;
Mitsuhashi, Riichiru
;
Okuno, Yasutoshi
;
Akheyar, Amal
;
Cho, Hag-Ju
;
Hooker, J.C.
;
Paraschiv, Vasile  
;
Vos, Rita  
;
Sebaai, Farid  
;
Ercken, Monique  
;
Kelkar, Prasad
;
Delabie, Annelies  
;
Adelmann, Christoph  
;
Witters, Thomas  
;
Ragnarsson, Lars-Ake  
;
Kerner, Christoph  
;
Chiarella, Thomas  
;
Aoulaiche, Marc
;
Cho, Moon Ju
;
Kauerauf, Thomas
;
De Meyer, Kristin  
;
Lauwers, Anne  
;
Hoffmann, Thomas Y.
;
Absil, Philippe  
;
Biesemans, Serge  

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1940 since deposited on 2021-10-17
Acq. date: 2025-10-23

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1940 since deposited on 2021-10-17
Acq. date: 2025-10-23

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