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Browsing by Author "Hsieh, Robert"

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    Large area interposer lithography

    Flack, Warren
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    Hsieh, Robert
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    Kenyon, Gareth
    ;
    Ranjan, Manish
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    Slabbekoorn, John  
    ;
    Miller, Andy  
    Proceedings paper
    2014, IEEE 64th Electronic Components and Technology Conference - ECTC, 27/05/2014, p.26-32
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    Microbump lithography for 3D stacking applications

    Jaenen, Patrick  
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    Slabbekoorn, John  
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    Miller, Andy  
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    Flack, Warren W.
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    Ranjan, Manish
    Meeting abstract
    2013, 10th International Wafer-Level Packaging Conference - IWPLC, 4/11/2013
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    One micron damascene redistribution for fan-out wafer level packaging using a photosensitive dielectric material

    Flack, Warren
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    Hsieh, Robert
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    Nguyen, Ha-Ai
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    Slabbekoorn, John  
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    Suhard, Samuel  
    ;
    Miller, Andy  
    Proceedings paper
    2018, 2018 IEEE 20th Electronics Packaging Technology Conference (EPTC), 4/12/2018, p.395-400
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    One micron redistribution for fan-out wafer level packaging

    Flack, Warren
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    Hsieh, Robert
    ;
    Nguyen, Ha-Ai
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    Slabbekoorn, John  
    ;
    Lorant, Christophe  
    ;
    Miller, Andy  
    Proceedings paper
    2017, IEEE 19th Electronics Packaging Technology Conference - EPTC, 6/12/2017, p.1-7
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    Optimization of through Si via last microlithography for 3D packaging

    Slabbekoorn, John  
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    Tobback, Bert  
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    Vandeweyer, Tom  
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    Miller, Andy  
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    Flack, Warren
    ;
    Hsieh, Robert
    Proceedings paper
    2015, 13th International Wafer-Level Packaging Workshop - IWLPC, 13/10/2015
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    Overlay performance of through Si via last lithography for 3d packaging

    Flack, Warren
    ;
    Hsieh, Robert
    ;
    Kenyon, Gareth
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    Slabbekoorn, John  
    ;
    Czarnecki, Piotr  
    ;
    Tobback, Bert  
    Proceedings paper
    2016, IEEE 18th Electronics Packaging Technology Conference - EPTC, 30/11/2016, p.564-568
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    Process characterization for donut TSV's

    Slabbekoorn, John  
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    Schepers, Bart
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    Sardo, Stefano  
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    Van Huylenbroeck, Stefaan  
    ;
    Vandeweyer, Tom  
    Meeting abstract
    2014, International Wafer-Level Packaging Conference - IWLPC, 11/11/2014

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