Browsing by Author "Huang, Zhen-Hong"

Analysis of Trap-Induced Dynamic Degradation in AlGaN/GaN Gated-Edge Termination Schottky Barrier Diodes Under Continuous Switching Operation

High Threshold Voltage Enhancement-Mode Regrown p-GaN Gate HEMTs With a Robust Forward Time-Dependent Gate Breakdown Stability

Toward Understanding the Failure Mechanism in p-GaN Gate HEMTs Operating in Reverse Conduction Diode Mode

Ultra-Fast Positive Gate Bias Stress ( 100ns) to Understand the Hole Injection in Power p-GaN HEMTs

Using Gate Leakage Conduction to Understand Positive Gate Bias Induced Threshold Voltage Shift in p-GaN Gate HEMTs