Publication:
Toward Understanding the Failure Mechanism in p-GaN Gate HEMTs Operating in Reverse Conduction Diode Mode
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634 since deposited on 2024-07-04
1last month
Acq. date: 2025-12-11
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Metrics
Views
634 since deposited on 2024-07-04
1last month
Acq. date: 2025-12-11
Citations