Publication:

Toward Understanding the Failure Mechanism in p-GaN Gate HEMTs Operating in Reverse Conduction Diode Mode

Date

2024

Journal article

https://doi.org/10.1109/TED.2024.3412095

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Author(s)

;

Bakeroot, Benoit

;

Huang, Zhen-Hong

;

;

;

Wellekens, Dirk

;

Posthuma, Niels

;

Decoutere, Stefaan

;

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

Statistics

634 since deposited on 2024-07-04

Acq. date: 2026-02-24