Browsing by Author "Hue, Florent"
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Publication Strain mapping of tensile strained silicon transistors with embedded Si1yCy source and drain by dark-field holography
Journal article2009, Applied Physics Letters, (95) 7, p.73103Publication Strain measurements in electronic devices by aberration-corrected HRTEM and dark-field holography
Proceedings paper2008-09, 14th European Microscopy Congress, 1/09/2008, p.123-124Publication Strain measurements in transistors by dark-field holography
Oral presentation2009, Microscopy of Semiconducting Materials MSM XVI