Browsing by Author "Hull, R."

Characterization of strain in an advanced semiconductor laser structure with nanometer range resolution using a new algorithm for electron diffraction contrast imaging interpretation

Electron diffraction contrast imaging as a tool for nano-range strain analysis and application to a semiconductor laser structure

Localised strain characterisation in semiconductor structures using electron diffraction contrast imaging

Strain Analysis with Nanometer Resolution using a Conventional Transmission Electron Microscope Technique: Electron Diffraction Contrast Imaging Revisited