Browsing by Author "Iannaccone, G."
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Publication Characterization of soft breakdown in thin oxide NMOSFETs based on the analysis of the substrate current
Journal article2001, IEEE Trans. Electron Devices, (48) 6, p.1109-1113Publication Extraction of physical parameters of alternative high-k gate stacks through comparison between measurements and quantum simulations
Proceedings paper2005-04, 6th European Conference on Ultimate Integration of Silicon - ULIS, 7/04/2005, p.35-38Publication Origin of the substrate current after soft-breakdown in thin oxide n-MOSFETs
Proceedings paper1999, IFPA '99 - Proceedings of the 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits;, p.77-80