Characterization of soft breakdown in thin oxide NMOSFETs based on the analysis of the substrate current

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Author(s)

Crupi, Felice

;

Iannaccone, G.

;

Crupi, Isodiana

;

Degraeve, Robin

;

Groeseneken, Guido

;

Maes, Herman

Journal

IEEE Trans. Electron Devices

Metrics

1932 since deposited on 2021-10-14

Acq. date: 2025-12-08