Browsing by Author "Iannacone, G."
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Publication A model for MOS gate stack quality evaluation based on the gate current 1/f noise
Proceedings paper2008, 9th European Workshop on Ultimate Integration of Silicon - ULIS, 12/03/2008, p.141-144Publication Analytical model for the 1/f noise in the tunneling current through metal-oxide-semiconductor structures
Journal article2009, Journal of Applied Physics, (106) 7, p.73710Publication Modeling the gate current 1/f noise and its application to advanced CMOS devices
Proceedings paper2008, 9th International Conference on Solid-State and Integrated-Circuit Technology - IC-SICT, 20/10/2008, p.420-423