Publication:

A model for MOS gate stack quality evaluation based on the gate current 1/f noise

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1944 since deposited on 2021-10-17
Acq. date: 2025-10-23

Citations

Metrics

Views

1944 since deposited on 2021-10-17
Acq. date: 2025-10-23

Citations