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Analytical model for the 1/f noise in the tunneling current through metal-oxide-semiconductor structures
Publication:
Analytical model for the 1/f noise in the tunneling current through metal-oxide-semiconductor structures
Date
2009
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Crupi, F.
;
Giusi, G.
;
Iannacone, G.
;
Magnone, P.
;
Pace, C.
;
Simoen, Eddy
;
Claeys, Cor
Journal
Journal of Applied Physics
Abstract
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1957
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1957
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations