Browsing by Author "Illarionov, Yu. Yu."
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Publication A reliable method for the extraction of the lateral position of defects in ultra-scaled MOSFETs
Proceedings paper2014, International Reliability Physics Symposium - IRPS, 1/06/2014, p.XT.13Publication Process implications on the stability and reliability of 300 mm FAB MoS2 field-effect transistors
Journal article2024-FEB 2, NPJ 2D MATERIALS AND APPLICATIONS, (8) 1, p.8