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Browsing by Author "Illarionov, Yu. Yu."

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    A reliable method for the extraction of the lateral position of defects in ultra-scaled MOSFETs

    Illarionov, Yu. Yu.
    ;
    Bina, M.
    ;
    Tyaginov, S. E.
    ;
    Rott, K.
    ;
    Reisinger, H.
    ;
    Kaczer, Ben  
    ;
    Grasser, T.
    Proceedings paper
    2014, International Reliability Physics Symposium - IRPS, 1/06/2014, p.XT.13

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