Browsing by Author "Inoue, Koji"
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Publication Atom-probe-tomographic studies on silicon-based semiconductor devices
;Inoue, Koji ;Kambham, Ajay Kumar ;Mangelinck, Dominique ;Lawrence, DanKelly, Thomas F.Journal article2012, Microscopy Today, (20) 5, p.38-44Publication Industrial application of atom probe tomography to semiconductor devices
;Giddings, Alexander Devin ;Koelling, Sebastian ;Shimizu, ShimizuEstivill, RobertJournal article2018, Scripta Materialia, 148, p.82-90