Browsing by Author "Jabs, Dominic"

First–principles parameter–free modeling of n– and p–FET hot–carrier degradation

Impact of mixed negative bias temperature instability and hot carrier stress on MOSFET characteristics – Part II: theory

Mixed hot-carrier/bias temperature instability degradation regimes in full {VG, VD} bias space: implications and peculiarities

Quantum Chemistry Treatment of Silicon-Hydrogen Bond Rupture by Nonequilibrium Carriers in Semiconductor Devices